Evidence of a full gap in LaFeAsO1−xFx thin films from infrared spectroscopy
نویسندگان
چکیده
Xiaoxiang Xi,1 Y. M. Dai,2 C. C. Homes,2 M. Kidszun,3 S. Haindl,3 and G. L. Carr1 1Photon Sciences, Brookhaven National Laboratory, Upton, New York 11973, USA 2Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York 11973, USA 3Institute for Solid State Research, Leibniz Institute for Solid State and Materials Research Dresden, Helmholtzstrasse 20, 01069 Dresden, Germany (Received 23 April 2013; revised manuscript received 24 May 2013; published 31 May 2013)
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تاریخ انتشار 2013